SONET/SDH and DWDM Optical Testing
TSI-5320 SONET / SDH Optical Test System


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TSI-5320-2 Four-Slot Shelf
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TSI-5320-2P Four Slot Portable Chassis




  • Generate and analyze different simultaneous patterns on OC-192/STM-64 and OC-48/STM-16
    For OC-192/STM-64:Any combinations of STS-192c/STS-48c/STS-12c/STS-3c/STS-1c or any combinations of STM-64c/STM-16c/STM-4c/STM-1c.
    For OC-48/STM-16: Any combinations of STS-48c/STS-12c/STS-3c/STS-1c or any combinations of STM-16c/STM-4c/STM-1c.
  • Full overhead access and analysis including detection of change in overhead bytes by a Receiver Card.
  • Error insertion of B1, B2, B3, pattern and random by the Transmitter Cards.
  • Error detection of B1, B2, B3, pattern and framing by the Receiver Cards.
  • Internal reference oscillator, external DS-1, or E1 or any receiver slot for reference timing.
  • THRU Mode for distributing a STS-48/STM-16 received signal.
  • Control and readout of Path and Transport Overhead.
  • DCC drop and insert for line and section.
  • Software stored on the CPU/Clock card in flash permitting easy upgrading of a test system.
  • Ethernet 10BaseT interface for control.
  • Java graphical interface for full test and control.
  • Up to fourteen simultaneous users supported per chassis
  • Full range of BER testing of all concatenated and tributary signals.
  • High density testing for low cost per port.
  • Testing for North American and ITU protocols.
  • Highest throughput for carrier and manufacturing applications.
  • JAVA GUI supports multiple simultaneous users.


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Copyright © 2004